Skyray XRF will Introduce Instruments at MJSA Jewelry Expo

Released on: March 13, 2008, 11:55 am

Press Release Author: Skyray XRF

Industry: Apparel & Fashion

Press Release Summary: Skyray XRF will introduce two new x-ray fluorescence
instruments at the MJSA Exposition (April13-15, NYC) for various testing needs in
the jewelry industry.

Press Release Body: Skyray XRF will introduce two x-ray fluorescence (XRF)
instruments designed for the needs of the jewelry industry at the 2008 MJSA Expo
(New York City, April 13-15). The instruments that Skyray XRF will introduce at
booth 221 are the EDX-2800 and EDX-3000. Both units are low-cost alternatives for
performing non-destructive karat analysis, plating thickness measurements, alloy
testing and bulk analysis.

The EDX-2800 will also provide users with the ability to test for hazardous
substances (lead, cadmium, etc) that are affecting jewelry retailers, importers and
contract manufacturers. Hazardous substances in retail products create a health
risk for consumers and many states are developing policies to insure that
contaminants do not exceed hazardous levels. These regulations are creating a need
for hazardous substance testing throughout the jewelry industry.

The new equipment will be available for demonstration and review throughout the MJSA
Expo at the Skyray XRF booth (221). For a demonstration specific to your
organizations testing need, please contact Jeff Henseler (716-204-2388) prior to the
show to schedule a demonstration time.

Skyray XRF is the North American representative of Skyray Instrument, Inc, a leader
in XRF manufacturing and technology. Additional information about the Skyray XRF
product line can be found at www.skyrayxrf.com. Skyray XRF will be exhibiting at
the MJSA Expo booth 221 (April 13th - 15th in New York City).


Web Site: http://www.skyrayxrf.com

Contact Details: 35 Fairway Drive West
Georgetown, DE 19947
716-204-2388
jeff@skyrayxrf.com

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